TEST_NAME : Wafer
TEST_DATE : 24_09_13-13_24_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-010-027-05 | FUSED_ID : 6359364768400187829
  IC_TEMP :  -50.23 | VDDM : 1125.59 | AUX_INT :  -35.76 | CsaBias :   61.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74985e-03 / 2
  ADC_P0  : -3.57559e-02 ± 2.99714e-02
  ADC_P1  : 8.95112e-03 ± 7.40059e-04
  ADC_P2  : -7.46055e-06 ± 3.61578e-06
  CSA_Chi2/NDF : 1.05058e-04 / 2
  CSA_P0  : 5.95597e-02 ± 6.83656e-03
  CSA_P1  : 9.48669e-03 ± 5.15085e-04
  CSA_P2  : -3.86313e-05 ± 7.84414e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [56, 60, 68, 69, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [10, 32, 33, 63, 65, 100, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2607', '1.800', '0.1480', '1.800', '0.0868', '7.000', '0.7079', 1, 1, 1, 1, 1726226668.5470052]
VI_after__Init : ['1.202', '0.2607', '1.800', '0.1480', '1.800', '0.0817', '7.000', '0.7079', 1, 1, 1, 1, 1726226677.2204232]
VI_at__the_End : ['1.202', '0.5002', '1.800', '0.1373', '1.801', '0.1107', '7.000', '0.7085', 1, 1, 1, 1, 1726226744.2639883]