TEST_NAME : Wafer
TEST_DATE : 24_09_13-14_07_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-011-002-15 | FUSED_ID : 6359364768400191535
  IC_TEMP :  -52.95 | VDDM : 1110.64 | AUX_INT :   -7.54 | CsaBias :   85.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15022e-03 / 2
  ADC_P0  : -7.54224e-03 ± 2.29353e-02
  ADC_P1  : 8.56465e-03 ± 5.67761e-04
  ADC_P2  : -6.51678e-06 ± 2.78595e-06
  CSA_Chi2/NDF : 1.24670e-04 / 2
  CSA_P0  : 5.77381e-02 ± 7.44738e-03
  CSA_P1  : 9.78876e-03 ± 5.61107e-04
  CSA_P2  : -4.24470e-05 ± 8.54499e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [43, 52, 85, 87, 92, 100, 104, 106, 109, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [80, 95, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2093', '1.800', '0.1599', '1.800', '0.0868', '7.000', '0.7081', 1, 1, 1, 1, 1726229254.545]
VI_after__Init : ['1.202', '0.2093', '1.800', '0.1599', '1.800', '0.0814', '7.000', '0.7079', 1, 1, 1, 1, 1726229263.3753755]
VI_at__the_End : ['1.202', '0.5021', '1.800', '0.1431', '1.803', '0.1108', '6.999', '0.7090', 1, 1, 1, 1, 1726229331.5580535]