TEST_NAME : Wafer
TEST_DATE : 24_09_13-13_56_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-011-008-15 | FUSED_ID : 6359364768400191631
  IC_TEMP :  -51.42 | VDDM : 1129.35 | AUX_INT :   -5.90 | CsaBias :   82.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04346e-03 / 2
  ADC_P0  : -5.90410e-03 ± 2.19353e-02
  ADC_P1  : 8.09328e-03 ± 5.38919e-04
  ADC_P2  : -4.40081e-06 ± 2.62625e-06
  CSA_Chi2/NDF : 1.17624e-04 / 2
  CSA_P0  : 6.01119e-02 ± 7.23385e-03
  CSA_P1  : 9.79907e-03 ± 5.45019e-04
  CSA_P2  : -4.48844e-05 ± 8.29999e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [20, 24, 46, 50]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [13, 33, 60, 101, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2310', '1.800', '0.1734', '1.799', '0.0870', '7.000', '0.7082', 1, 1, 1, 1, 1726228619.6496344]
VI_after__Init : ['1.202', '0.2313', '1.800', '0.1735', '1.799', '0.0813', '7.000', '0.7079', 1, 1, 1, 1, 1726228627.87303]
VI_at__the_End : ['1.202', '0.4948', '1.800', '0.1387', '1.804', '0.1127', '7.000', '0.7086', 1, 1, 1, 1, 1726228688.6733923]