TEST_NAME : Wafer
TEST_DATE : 24_09_13-13_52_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-011-011-15 | FUSED_ID : 6359364768400191679
  IC_TEMP :  -57.33 | VDDM : 1107.71 | AUX_INT :   -8.62 | CsaBias :   59.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13419e-03 / 2
  ADC_P0  : -8.61555e-03 ± 2.27822e-02
  ADC_P1  : 8.56879e-03 ± 5.65797e-04
  ADC_P2  : -6.32028e-06 ± 2.79201e-06
  CSA_Chi2/NDF : 1.65129e-04 / 2
  CSA_P0  : 5.97678e-02 ± 8.57106e-03
  CSA_P1  : 1.00971e-02 ± 6.45767e-04
  CSA_P2  : -5.09578e-05 ± 9.83427e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [38, 53, 65, 85, 86, 106, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [16, 19, 43, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2368', '1.800', '0.1646', '1.800', '0.0892', '6.999', '0.7081', 1, 1, 1, 1, 1726228325.6450434]
VI_after__Init : ['1.202', '0.2368', '1.800', '0.1645', '1.800', '0.0838', '7.004', '0.7080', 1, 1, 1, 1, 1726228333.6653593]
VI_at__the_End : ['1.202', '0.4911', '1.800', '0.1401', '1.800', '0.1131', '6.999', '0.7087', 1, 1, 1, 1, 1726228395.5127504]