TEST_NAME : Wafer
TEST_DATE : 24_09_13-13_50_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-011-012-15 | FUSED_ID : 6359364768400191695
  IC_TEMP :  -49.55 | VDDM : 1124.98 | AUX_INT :   -6.80 | CsaBias :   82.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.92098e-04 / 2
  ADC_P0  : -6.79614e-03 ± 2.13256e-02
  ADC_P1  : 8.16097e-03 ± 5.13859e-04
  ADC_P2  : -5.27113e-06 ± 2.45851e-06
  CSA_Chi2/NDF : 1.14457e-04 / 2
  CSA_P0  : 5.86167e-02 ± 7.13580e-03
  CSA_P1  : 9.90040e-03 ± 5.37631e-04
  CSA_P2  : -4.64778e-05 ± 8.18749e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [13, 66, 104, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [29, 45, 103, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3634', '1.800', '0.1443', '1.800', '0.0925', '6.999', '0.7081', 1, 1, 1, 1, 1726228228.339402]
VI_after__Init : ['1.202', '0.3635', '1.800', '0.1443', '1.800', '0.0873', '7.001', '0.7078', 1, 1, 1, 1, 1726228236.3907907]
VI_at__the_End : ['1.202', '0.4956', '1.800', '0.1373', '1.800', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1726228295.225328]