TEST_NAME : Wafer
TEST_DATE : 24_09_13-13_32_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-011-023-08 | FUSED_ID : 6359364768400191864
  IC_TEMP :  -51.52 | VDDM : 1112.64 | AUX_INT :   -5.98 | CsaBias :   90.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.80716e-04 / 2
  ADC_P0  : -5.98407e-03 ± 2.12057e-02
  ADC_P1  : 8.14354e-03 ± 5.10412e-04
  ADC_P2  : -5.43964e-06 ± 2.42641e-06
  CSA_Chi2/NDF : 1.27113e-04 / 2
  CSA_P0  : 5.85788e-02 ± 7.51999e-03
  CSA_P1  : 9.83984e-03 ± 5.66577e-04
  CSA_P2  : -4.43968e-05 ± 8.62829e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [75, 84, 96, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [4, 19, 56, 86, 90, 93, 108, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3507', '1.800', '0.1394', '1.800', '0.0920', '7.000', '0.7077', 1, 1, 1, 1, 1726227156.9604921]
VI_after__Init : ['1.202', '0.3502', '1.800', '0.1394', '1.800', '0.0867', '7.000', '0.7079', 1, 1, 1, 1, 1726227165.1398585]
VI_at__the_End : ['1.202', '0.4994', '1.800', '0.1365', '1.800', '0.1111', '7.000', '0.7087', 1, 1, 1, 1, 1726227233.1874902]