TEST_NAME : Wafer
TEST_DATE : 24_09_13-13_27_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-011-026-08 | FUSED_ID : 6359364768400191912
  IC_TEMP :  -51.82 | VDDM : 1126.56 | AUX_INT :   -7.19 | CsaBias :   80.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14790e-03 / 2
  ADC_P0  : -7.19091e-03 ± 2.29650e-02
  ADC_P1  : 8.05059e-03 ± 5.47035e-04
  ADC_P2  : -5.01880e-06 ± 2.58957e-06
  CSA_Chi2/NDF : 1.19497e-04 / 2
  CSA_P0  : 5.68287e-02 ± 7.29123e-03
  CSA_P1  : 9.92209e-03 ± 5.49341e-04
  CSA_P2  : -4.43870e-05 ± 8.36582e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 60, 82, 87, 101, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [38, 41, 43, 78, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3267', '1.800', '0.1524', '1.799', '0.0854', '7.000', '0.7079', 1, 1, 1, 1, 1726226862.9046547]
VI_after__Init : ['1.202', '0.3267', '1.800', '0.1523', '1.800', '0.0800', '7.000', '0.7079', 1, 1, 1, 1, 1726226870.9499428]
VI_at__the_End : ['1.202', '0.5009', '1.800', '0.1381', '1.800', '0.1106', '7.000', '0.7088', 1, 1, 1, 1, 1726226938.2886848]