TEST_NAME : Wafer
TEST_DATE : 24_09_13-13_26_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-011-027-08 | FUSED_ID : 6359364768400191928
  IC_TEMP :  -54.50 | VDDM : 1118.46 | AUX_INT :   -7.75 | CsaBias :   75.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42890e-03 / 2
  ADC_P0  : -7.74915e-03 ± 2.56598e-02
  ADC_P1  : 8.41204e-03 ± 6.38883e-04
  ADC_P2  : -5.42248e-06 ± 3.16272e-06
  CSA_Chi2/NDF : 1.25603e-04 / 2
  CSA_P0  : 5.70179e-02 ± 7.47520e-03
  CSA_P1  : 9.88875e-03 ± 5.63203e-04
  CSA_P2  : -4.63525e-05 ± 8.57691e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [6, 21, 32, 37, 72]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [19, 20, 37, 47, 68, 71, 77, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2739', '1.800', '0.1592', '1.800', '0.0874', '7.000', '0.7086', 1, 1, 1, 1, 1726226765.865244]
VI_after__Init : ['1.202', '0.2739', '1.800', '0.1592', '1.799', '0.0795', '7.000', '0.7081', 1, 1, 1, 1, 1726226773.995673]
VI_at__the_End : ['1.202', '0.4914', '1.800', '0.1372', '1.800', '0.1143', '7.000', '0.7086', 1, 1, 1, 1, 1726226840.65736]