TEST_NAME : Wafer
TEST_DATE : 24_09_13-14_09_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-012-002-07 | FUSED_ID : 6359364768400195623
  IC_TEMP :  -55.79 | VDDM : 1131.76 | AUX_INT :   -5.96 | CsaBias :   76.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.89231e-04 / 2
  ADC_P0  : -5.95783e-03 ± 2.01470e-02
  ADC_P1  : 8.31265e-03 ± 4.86468e-04
  ADC_P2  : -6.27431e-06 ± 2.31411e-06
  CSA_Chi2/NDF : 1.24066e-04 / 2
  CSA_P0  : 5.83266e-02 ± 7.42931e-03
  CSA_P1  : 9.50488e-03 ± 5.59745e-04
  CSA_P2  : -3.95881e-05 ± 8.52425e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [66, 88, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [14, 20, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2470', '1.800', '0.1487', '1.800', '0.0870', '7.000', '0.7086', 1, 1, 1, 1, 1726229376.0746286]
VI_after__Init : ['1.202', '0.2470', '1.800', '0.1488', '1.800', '0.0812', '6.999', '0.7079', 1, 1, 1, 1, 1726229384.2099705]
VI_at__the_End : ['1.202', '0.4934', '1.800', '0.1403', '1.800', '0.1103', '7.003', '0.7081', 1, 1, 1, 1, 1726229451.943704]