TEST_NAME : Wafer
TEST_DATE : 24_09_13-14_11_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-012-003-07 | FUSED_ID : 6359364768400195639
  IC_TEMP :  -55.11 | VDDM : 1133.30 | AUX_INT :   -7.23 | CsaBias :   94.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26789e-03 / 2
  ADC_P0  : -7.23235e-03 ± 2.41357e-02
  ADC_P1  : 8.54859e-03 ± 6.06186e-04
  ADC_P2  : -5.99998e-06 ± 3.01703e-06
  CSA_Chi2/NDF : 1.30912e-04 / 2
  CSA_P0  : 6.04200e-02 ± 7.63153e-03
  CSA_P1  : 9.95549e-03 ± 5.74980e-04
  CSA_P2  : -4.34824e-05 ± 8.75627e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [0, 8, 43, 51, 53, 58, 67, 90, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [36, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2645', '1.800', '0.1611', '1.800', '0.0882', '6.999', '0.7081', 1, 1, 1, 1, 1726229472.823206]
VI_after__Init : ['1.202', '0.2645', '1.800', '0.1610', '1.800', '0.0825', '7.000', '0.7083', 1, 1, 1, 1, 1726229480.8885734]
VI_at__the_End : ['1.202', '0.5109', '1.800', '0.1433', '1.801', '0.1114', '7.000', '0.7088', 1, 1, 1, 1, 1726229541.8338892]