TEST_NAME : Wafer
TEST_DATE : 24_09_13-15_26_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-013-005-10 | FUSED_ID : 6359364768400199770
  IC_TEMP :  -52.43 | VDDM : 1127.35 | AUX_INT :   -6.52 | CsaBias :   92.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00677e-03 / 2
  ADC_P0  : -6.52201e-03 ± 2.14832e-02
  ADC_P1  : 8.31826e-03 ± 5.26625e-04
  ADC_P2  : -5.64838e-06 ± 2.55622e-06
  CSA_Chi2/NDF : 1.18548e-04 / 2
  CSA_P0  : 5.98309e-02 ± 7.26222e-03
  CSA_P1  : 9.90875e-03 ± 5.47156e-04
  CSA_P2  : -4.43063e-05 ± 8.33253e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [8, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [3, 4, 22, 33, 45, 76, 81, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2296', '1.800', '0.1631', '1.800', '0.0906', '7.000', '0.7079', 1, 1, 1, 1, 1726233987.0530217]
VI_after__Init : ['1.202', '0.2297', '1.800', '0.1631', '1.800', '0.0848', '7.000', '0.7079', 1, 1, 1, 1, 1726233995.2323415]
VI_at__the_End : ['1.202', '0.5044', '1.800', '0.1389', '1.800', '0.1114', '7.000', '0.7087', 1, 1, 1, 1, 1726234051.6847608]