TEST_NAME : Wafer
TEST_DATE : 24_09_13-15_23_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-013-007-10 | FUSED_ID : 6359364768400199802
  IC_TEMP :  -58.82 | VDDM : 1123.63 | AUX_INT :   -6.39 | CsaBias :   68.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03673e-03 / 2
  ADC_P0  : -6.39184e-03 ± 2.17937e-02
  ADC_P1  : 8.33249e-03 ± 5.32517e-04
  ADC_P2  : -5.90873e-06 ± 2.57048e-06
  CSA_Chi2/NDF : 1.26493e-04 / 2
  CSA_P0  : 5.93748e-02 ± 7.50162e-03
  CSA_P1  : 9.60585e-03 ± 5.65193e-04
  CSA_P2  : -4.44200e-05 ± 8.60722e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [6, 48, 90, 112, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [10, 29, 61, 87, 104, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1794', '1.800', '0.1480', '1.800', '0.0813', '7.000', '0.7076', 1, 1, 1, 1, 1726233791.503184]
VI_after__Init : ['1.202', '0.1796', '1.800', '0.1479', '1.801', '0.0760', '7.000', '0.7079', 1, 1, 1, 1, 1726233800.2605734]
VI_at__the_End : ['1.202', '0.4843', '1.800', '0.1366', '1.799', '0.1146', '7.000', '0.7085', 1, 1, 1, 1, 1726233867.401415]