TEST_NAME : Wafer
TEST_DATE : 24_09_13-15_16_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-013-011-10 | FUSED_ID : 6359364768400199866
  IC_TEMP :  -54.50 | VDDM : 1130.50 | AUX_INT :   -6.37 | CsaBias :   82.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13189e-03 / 2
  ADC_P0  : -6.37026e-03 ± 2.28223e-02
  ADC_P1  : 8.15797e-03 ± 5.55880e-04
  ADC_P2  : -5.03710e-06 ± 2.68147e-06
  CSA_Chi2/NDF : 1.33946e-04 / 2
  CSA_P0  : 6.02019e-02 ± 7.71946e-03
  CSA_P1  : 9.97605e-03 ± 5.81606e-04
  CSA_P2  : -4.61408e-05 ± 8.85716e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [29, 31, 81, 91, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [31, 73, 86, 102, 105, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3932', '1.800', '0.1731', '1.800', '0.0963', '7.000', '0.7085', 1, 1, 1, 1, 1726233403.4717402]
VI_after__Init : ['1.202', '0.3932', '1.800', '0.1732', '1.800', '0.0891', '7.000', '0.7076', 1, 1, 1, 1, 1726233412.4260037]
VI_at__the_End : ['1.202', '0.4986', '1.800', '0.1392', '1.800', '0.1123', '7.000', '0.7085', 1, 1, 1, 1, 1726233479.1769545]