TEST_NAME : Wafer
TEST_DATE : 24_09_13-15_10_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-013-015-10 | FUSED_ID : 6359364768400199930
  IC_TEMP :  -56.61 | VDDM : 1124.06 | AUX_INT :   -8.46 | CsaBias :   85.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13122e-03 / 2
  ADC_P0  : -8.45689e-03 ± 2.27450e-02
  ADC_P1  : 8.58120e-03 ± 5.63052e-04
  ADC_P2  : -6.58012e-06 ± 2.76285e-06
  CSA_Chi2/NDF : 1.72716e-04 / 2
  CSA_P0  : 5.82045e-02 ± 8.76574e-03
  CSA_P1  : 1.02065e-02 ± 6.60435e-04
  CSA_P2  : -5.12462e-05 ± 1.00576e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [19, 44, 86, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [57, 70, 85, 89, 108, 110, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4767', '1.800', '0.1321', '1.799', '0.0961', '7.000', '0.7077', 1, 1, 1, 1, 1726233014.664156]
VI_after__Init : ['1.202', '0.4770', '1.800', '0.1321', '1.800', '0.0905', '7.000', '0.7079', 1, 1, 1, 1, 1726233022.7095025]
VI_at__the_End : ['1.202', '0.4956', '1.800', '0.1408', '1.800', '0.1135', '7.000', '0.7083', 1, 1, 1, 1, 1726233089.6845853]