TEST_NAME : Wafer
TEST_DATE : 24_09_13-15_07_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-013-017-13 | FUSED_ID : 6359364768400199965
  IC_TEMP :  -50.08 | VDDM : 1130.78 | AUX_INT :   -5.81 | CsaBias :   83.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.50159e-04 / 2
  ADC_P0  : -5.81230e-03 ± 1.72325e-02
  ADC_P1  : 8.18843e-03 ± 4.18239e-04
  ADC_P2  : -5.51974e-06 ± 2.00049e-06
  CSA_Chi2/NDF : 6.56734e-05 / 2
  CSA_P0  : 5.83591e-02 ± 5.40527e-03
  CSA_P1  : 9.20568e-03 ± 4.07248e-04
  CSA_P2  : -3.67535e-05 ± 6.20190e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [38, 45, 50, 56, 62, 67, 85, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [4, 10, 23, 63, 69, 85, 95, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2428', '1.800', '0.1376', '1.800', '0.0856', '7.000', '0.7077', 1, 1, 1, 1, 1726232820.733887]
VI_after__Init : ['1.202', '0.2429', '1.800', '0.1376', '1.799', '0.0802', '7.000', '0.7076', 1, 1, 1, 1, 1726232828.8633132]
VI_at__the_End : ['1.202', '0.4903', '1.800', '0.1355', '1.810', '0.1113', '7.000', '0.7086', 1, 1, 1, 1, 1726232895.9552596]