TEST_NAME : Wafer
TEST_DATE : 24_09_13-15_05_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-013-018-13 | FUSED_ID : 6359364768400199981
  IC_TEMP :  -53.66 | VDDM : 1130.17 | AUX_INT :  -83.01 | CsaBias :    9.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73468e-03 / 2
  ADC_P0  : -8.30057e-02 ± 3.26443e-02
  ADC_P1  : 9.31108e-03 ± 7.61563e-04
  ADC_P2  : -9.30709e-06 ± 3.50194e-06
  CSA_Chi2/NDF : 1.14214e-04 / 2
  CSA_P0  : 5.96459e-02 ± 7.12825e-03
  CSA_P1  : 1.01150e-02 ± 5.37062e-04
  CSA_P2  : -4.78503e-05 ± 8.17882e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [28, 42, 44, 46, 54, 63, 74]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [35, 56]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1919', '1.800', '0.1599', '1.800', '0.0877', '7.000', '0.7076', 1, 1, 1, 1, 1726232723.0771976]
VI_after__Init : ['1.202', '0.1920', '1.800', '0.1599', '1.800', '0.0820', '7.000', '0.7078', 1, 1, 1, 1, 1726232731.2477243]
VI_at__the_End : ['1.202', '0.5032', '1.800', '0.1404', '1.800', '0.1128', '7.000', '0.7083', 1, 1, 1, 1, 1726232799.1974916]