TEST_NAME : Wafer
TEST_DATE : 24_09_13-14_58_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-013-022-13 | FUSED_ID : 6359364768400200045
  IC_TEMP :  -51.79 | VDDM : 1132.06 | AUX_INT :   -7.90 | CsaBias :   84.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20678e-03 / 2
  ADC_P0  : -7.89501e-03 ± 2.35723e-02
  ADC_P1  : 8.49244e-03 ± 5.97318e-04
  ADC_P2  : -5.33805e-06 ± 3.00436e-06
  CSA_Chi2/NDF : 1.11125e-04 / 2
  CSA_P0  : 5.99381e-02 ± 7.03118e-03
  CSA_P1  : 9.71905e-03 ± 5.29749e-04
  CSA_P2  : -4.19065e-05 ± 8.06744e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [11, 19, 26, 53, 70, 78, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [20, 31, 36, 57, 62, 69]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4251', '1.800', '0.1492', '1.799', '0.0971', '7.000', '0.7084', 1, 1, 1, 1, 1726232333.9256504]
VI_after__Init : ['1.201', '0.4250', '1.800', '0.1492', '1.800', '0.0900', '7.000', '0.7074', 1, 1, 1, 1, 1726232341.995062]
VI_at__the_End : ['1.202', '0.5045', '1.800', '0.1401', '1.800', '0.1104', '7.000', '0.7083', 1, 1, 1, 1, 1726232409.3160622]