TEST_NAME : Wafer
TEST_DATE : 24_09_13-14_55_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-013-024-13 | FUSED_ID : 6359364768400200077
  IC_TEMP :  -51.77 | VDDM : 1130.16 | AUX_INT :   -6.39 | CsaBias :   68.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03673e-03 / 2
  ADC_P0  : -6.39184e-03 ± 2.17937e-02
  ADC_P1  : 8.33249e-03 ± 5.32517e-04
  ADC_P2  : -5.90873e-06 ± 2.57048e-06
  CSA_Chi2/NDF : 8.59377e-05 / 2
  CSA_P0  : 5.85656e-02 ± 6.18321e-03
  CSA_P1  : 9.58438e-03 ± 4.65860e-04
  CSA_P2  : -3.97385e-05 ± 7.09450e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [33, 38, 40, 58, 65, 72, 76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [33, 42, 59, 84, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3230', '1.800', '0.1585', '1.800', '0.0869', '7.000', '0.7076', 1, 1, 1, 1, 1726232140.0911593]
VI_after__Init : ['1.202', '0.3231', '1.800', '0.1585', '1.800', '0.0813', '7.000', '0.7076', 1, 1, 1, 1, 1726232148.223608]
VI_at__the_End : ['1.202', '0.5013', '1.800', '0.1394', '1.807', '0.1103', '7.000', '0.7083', 1, 1, 1, 1, 1726232207.9951336]