TEST_NAME : Wafer
TEST_DATE : 24_09_13-15_39_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-014-008-04 | FUSED_ID : 6359364768400203908
  IC_TEMP :  -58.18 | VDDM : 1124.21 | AUX_INT :   -8.46 | CsaBias :   74.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49523e-03 / 2
  ADC_P0  : -8.46141e-03 ± 2.62193e-02
  ADC_P1  : 8.31363e-03 ± 6.36035e-04
  ADC_P2  : -5.67007e-06 ± 3.07101e-06
  CSA_Chi2/NDF : 1.64311e-04 / 2
  CSA_P0  : 5.92146e-02 ± 8.54981e-03
  CSA_P1  : 1.01350e-02 ± 6.44166e-04
  CSA_P2  : -5.08467e-05 ± 9.80989e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [5, 57, 93, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [17, 24, 60, 91, 103, 106, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2730', '1.800', '0.1606', '1.800', '0.0902', '7.000', '0.7079', 1, 1, 1, 1, 1726234765.4609196]
VI_after__Init : ['1.202', '0.2730', '1.800', '0.1606', '1.799', '0.0849', '7.000', '0.7075', 1, 1, 1, 1, 1726234773.5864182]
VI_at__the_End : ['1.202', '0.4886', '1.800', '0.1384', '1.799', '0.1153', '7.000', '0.7086', 1, 1, 1, 1, 1726234837.2303455]