TEST_NAME : Wafer
TEST_DATE : 24_09_16-08_28_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-014-020-03 | FUSED_ID : 6359364768400204099
  IC_TEMP :  -55.80 | VDDM : 1127.77 | AUX_INT :   -9.82 | CsaBias :   72.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43694e-03 / 2
  ADC_P0  : -9.82007e-03 ± 2.56460e-02
  ADC_P1  : 8.33650e-03 ± 6.13432e-04
  ADC_P2  : -6.16604e-06 ± 2.92108e-06
  CSA_Chi2/NDF : 1.59214e-04 / 2
  CSA_P0  : 5.84260e-02 ± 8.41614e-03
  CSA_P1  : 1.01574e-02 ± 6.34095e-04
  CSA_P2  : -4.82267e-05 ± 9.65652e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [32, 38, 71, 101, 110, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [79, 85, 95, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1429', '1.800', '0.1366', '1.800', '0.0835', '7.000', '0.7080', 1, 1, 1, 1, 1726468085.496781]
VI_after__Init : ['1.201', '0.1429', '1.800', '0.1365', '1.800', '0.0786', '7.000', '0.7079', 1, 1, 1, 1, 1726468093.6081555]
VI_at__the_End : ['1.201', '0.5033', '1.800', '0.1397', '1.800', '0.1121', '7.000', '0.7087', 1, 1, 1, 1, 1726468162.6468112]