TEST_NAME : Wafer
TEST_DATE : 24_09_16-08_29_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-014-021-03 | FUSED_ID : 6359364768400204115
  IC_TEMP :  -52.31 | VDDM : 1126.35 | AUX_INT :   -8.38 | CsaBias :   79.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09727e-03 / 2
  ADC_P0  : -8.38276e-03 ± 2.23970e-02
  ADC_P1  : 8.08511e-03 ± 5.24579e-04
  ADC_P2  : -5.71700e-06 ± 2.43683e-06
  CSA_Chi2/NDF : 9.64036e-05 / 2
  CSA_P0  : 5.64793e-02 ± 6.54891e-03
  CSA_P1  : 9.76524e-03 ± 4.93413e-04
  CSA_P2  : -4.37004e-05 ± 7.51410e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [14, 32, 33, 68, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [7, 18, 73, 91, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3658', '1.800', '0.1575', '1.800', '0.0920', '7.000', '0.7079', 1, 1, 1, 1, 1726468181.9333851]
VI_after__Init : ['1.201', '0.3652', '1.800', '0.1574', '1.800', '0.0867', '7.000', '0.7079', 1, 1, 1, 1, 1726468190.2826521]
VI_at__the_End : ['1.201', '0.4954', '1.800', '0.1362', '1.800', '0.1118', '7.000', '0.7087', 1, 1, 1, 1, 1726468256.7215695]