TEST_NAME : Wafer
TEST_DATE : 24_09_16-08_36_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-014-025-03 | FUSED_ID : 6359364768400204179
  IC_TEMP :  -43.57 | VDDM : 1121.55 | AUX_INT :   -7.56 | CsaBias :   93.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19072e-03 / 2
  ADC_P0  : -7.55756e-03 ± 2.34549e-02
  ADC_P1  : 7.84005e-03 ± 5.59981e-04
  ADC_P2  : -3.86027e-06 ± 2.66122e-06
  CSA_Chi2/NDF : 7.59345e-05 / 2
  CSA_P0  : 5.72169e-02 ± 5.81222e-03
  CSA_P1  : 9.20473e-03 ± 4.37909e-04
  CSA_P2  : -3.37927e-05 ± 6.66883e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [20, 24, 42, 45, 53, 87]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [19, 43, 94, 103, 104, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2010', '1.800', '0.1330', '1.800', '0.0857', '7.000', '0.7081', 1, 1, 1, 1, 1726468570.967528]
VI_after__Init : ['1.201', '0.2009', '1.800', '0.1329', '1.800', '0.0804', '7.000', '0.7079', 1, 1, 1, 1, 1726468579.1858425]
VI_at__the_End : ['1.201', '0.4988', '1.800', '0.1339', '1.800', '0.1085', '7.000', '0.7088', 1, 1, 1, 1, 1726468640.3921423]