TEST_NAME : Wafer
TEST_DATE : 24_09_16-09_19_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-016-009-01 | FUSED_ID : 6359364768400212113
  IC_TEMP :  -56.51 | VDDM : 1119.18 | AUX_INT :   -7.85 | CsaBias :   79.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.81078e-04 / 2
  ADC_P0  : -7.85419e-03 ± 2.11999e-02
  ADC_P1  : 8.03902e-03 ± 5.00697e-04
  ADC_P2  : -5.22074e-06 ± 2.34894e-06
  CSA_Chi2/NDF : 1.22504e-04 / 2
  CSA_P0  : 5.80357e-02 ± 7.38241e-03
  CSA_P1  : 9.76464e-03 ± 5.56211e-04
  CSA_P2  : -4.41488e-05 ± 8.47044e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [33, 44, 76, 77, 112, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [17, 36, 46, 69, 97, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3211', '1.800', '0.1576', '1.799', '0.0898', '7.000', '0.7079', 1, 1, 1, 1, 1726471191.5127091]
VI_after__Init : ['1.202', '0.3208', '1.800', '0.1575', '1.800', '0.0845', '7.000', '0.7079', 1, 1, 1, 1, 1726471199.71404]
VI_at__the_End : ['1.202', '0.4934', '1.800', '0.1373', '1.803', '0.1116', '7.000', '0.7086', 1, 1, 1, 1, 1726471265.413951]