TEST_NAME : Wafer
TEST_DATE : 24_09_16-09_24_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-016-012-01 | FUSED_ID : 6359364768400212161
  IC_TEMP :  -52.35 | VDDM : 1121.84 | AUX_INT :   -6.80 | CsaBias :   73.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00280e-03 / 2
  ADC_P0  : -6.80458e-03 ± 2.14268e-02
  ADC_P1  : 8.03593e-03 ± 5.04477e-04
  ADC_P2  : -5.39569e-06 ± 2.35400e-06
  CSA_Chi2/NDF : 1.05480e-04 / 2
  CSA_P0  : 5.74755e-02 ± 6.85027e-03
  CSA_P1  : 9.71578e-03 ± 5.16118e-04
  CSA_P2  : -4.34777e-05 ± 7.85987e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [0, 10, 28, 39, 45, 50, 54, 69, 75, 84, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [30, 35, 64, 67, 85, 88, 97, 112, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3217', '1.800', '0.1404', '1.800', '0.0942', '7.000', '0.7080', 1, 1, 1, 1, 1726471484.167893]
VI_after__Init : ['1.202', '0.3216', '1.800', '0.1404', '1.799', '0.0884', '7.006', '0.7076', 1, 1, 1, 1, 1726471492.2592278]
VI_at__the_End : ['1.202', '0.4934', '1.800', '0.1369', '1.804', '0.1136', '7.000', '0.7086', 1, 1, 1, 1, 1726471551.935702]