TEST_NAME : Wafer
TEST_DATE : 24_09_16-09_40_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-016-022-06 | FUSED_ID : 6359364768400212326
  IC_TEMP :  -53.66 | VDDM : 1128.94 | AUX_INT :   -7.87 | CsaBias :   80.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42591e-03 / 2
  ADC_P0  : -7.87298e-03 ± 2.56063e-02
  ADC_P1  : 8.13805e-03 ± 6.10054e-04
  ADC_P2  : -5.45375e-06 ± 2.88519e-06
  CSA_Chi2/NDF : 1.10141e-04 / 2
  CSA_P0  : 5.72283e-02 ± 6.99998e-03
  CSA_P1  : 9.80082e-03 ± 5.27398e-04
  CSA_P2  : -4.28800e-05 ± 8.03164e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [39, 59, 66, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [47, 56, 73, 80, 89, 114, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3149', '1.800', '0.1825', '1.800', '0.0870', '7.000', '0.7082', 1, 1, 1, 1, 1726472456.9842505]
VI_after__Init : ['1.202', '0.3149', '1.800', '0.1825', '1.801', '0.0813', '7.000', '0.7079', 1, 1, 1, 1, 1726472465.0116048]
VI_at__the_End : ['1.202', '0.5009', '1.800', '0.1384', '1.803', '0.1103', '7.000', '0.7089', 1, 1, 1, 1, 1726472525.027117]