TEST_NAME : Wafer
TEST_DATE : 24_09_16-09_42_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-016-023-06 | FUSED_ID : 6359364768400212342
  IC_TEMP :  -46.83 | VDDM : 1125.61 | AUX_INT :   -6.72 | CsaBias :   91.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17005e-03 / 2
  ADC_P0  : -6.72049e-03 ± 2.32267e-02
  ADC_P1  : 7.60145e-03 ± 5.31516e-04
  ADC_P2  : -4.01616e-06 ± 2.41753e-06
  CSA_Chi2/NDF : 5.60111e-05 / 2
  CSA_P0  : 5.81386e-02 ± 4.99182e-03
  CSA_P1  : 8.88006e-03 ± 3.76098e-04
  CSA_P2  : -3.00308e-05 ± 5.72753e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [15, 20, 73, 79, 106, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [14, 21, 29, 31, 34, 37, 81, 93, 112, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2164', '1.800', '0.1657', '1.800', '0.0881', '7.000', '0.7089', 1, 1, 1, 1, 1726472553.5879948]
VI_after__Init : ['1.202', '0.2165', '1.800', '0.1656', '1.800', '0.0806', '7.000', '0.7079', 1, 1, 1, 1, 1726472562.3933043]
VI_at__the_End : ['1.202', '0.4965', '1.800', '0.1345', '1.800', '0.1087', '7.000', '0.7087', 1, 1, 1, 1, 1726472628.5732813]