TEST_NAME : Wafer
TEST_DATE : 24_09_16-10_06_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-017-008-12 | FUSED_ID : 6359364768400216204
  IC_TEMP :  -50.94 | VDDM : 1130.03 | AUX_INT :  -74.58 | CsaBias :   27.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49448e-03 / 2
  ADC_P0  : -7.45838e-02 ± 2.97860e-02
  ADC_P1  : 9.39678e-03 ± 7.13375e-04
  ADC_P2  : -9.39872e-06 ± 3.35971e-06
  CSA_Chi2/NDF : 1.16846e-04 / 2
  CSA_P0  : 5.86208e-02 ± 7.20989e-03
  CSA_P1  : 9.70288e-03 ± 5.43213e-04
  CSA_P2  : -4.09191e-05 ± 8.27249e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [4, 11, 49, 59, 61, 65, 86, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [44, 96, 106, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1847', '1.800', '0.1370', '1.800', '0.0798', '7.000', '0.7081', 1, 1, 1, 1, 1726474012.9486637]
VI_after__Init : ['1.202', '0.1846', '1.800', '0.1370', '1.800', '0.0740', '7.000', '0.7079', 1, 1, 1, 1, 1726474021.8350906]
VI_at__the_End : ['1.202', '0.5026', '1.800', '0.1398', '1.800', '0.1117', '7.000', '0.7089', 1, 1, 1, 1, 1726474089.4207432]