TEST_NAME : Wafer
TEST_DATE : 24_09_16-09_58_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-017-013-12 | FUSED_ID : 6359364768400216284
  IC_TEMP :  -48.53 | VDDM : 1131.33 | AUX_INT :   -6.61 | CsaBias :   88.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.74507e-04 / 2
  ADC_P0  : -6.61337e-03 ± 2.00385e-02
  ADC_P1  : 7.96312e-03 ± 4.76741e-04
  ADC_P2  : -4.81600e-06 ± 2.24456e-06
  CSA_Chi2/NDF : 9.02474e-05 / 2
  CSA_P0  : 5.68003e-02 ± 6.33636e-03
  CSA_P1  : 9.51455e-03 ± 4.77399e-04
  CSA_P2  : -3.93240e-05 ± 7.27022e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [6, 51, 84, 94, 96, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [35, 47, 53, 84]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1853', '1.800', '0.1607', '1.800', '0.0880', '7.000', '0.7084', 1, 1, 1, 1, 1726473526.8204708]
VI_after__Init : ['1.202', '0.1848', '1.800', '0.1606', '1.799', '0.0826', '7.000', '0.7079', 1, 1, 1, 1, 1726473534.972739]
VI_at__the_End : ['1.202', '0.4969', '1.800', '0.1346', '1.799', '0.1104', '7.000', '0.7090', 1, 1, 1, 1, 1726473600.1647804]