TEST_NAME : Wafer
TEST_DATE : 24_09_16-09_49_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-017-019-11 | FUSED_ID : 6359364768400216379
  IC_TEMP :  -49.49 | VDDM : 1117.61 | AUX_INT :   -8.95 | CsaBias :   75.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46398e-03 / 2
  ADC_P0  : -8.95201e-03 ± 2.59808e-02
  ADC_P1  : 7.72581e-03 ± 5.93436e-04
  ADC_P2  : -4.52491e-06 ± 2.69921e-06
  CSA_Chi2/NDF : 9.31180e-05 / 2
  CSA_P0  : 5.86420e-02 ± 6.43634e-03
  CSA_P1  : 9.65334e-03 ± 4.84932e-04
  CSA_P2  : -4.06185e-05 ± 7.38494e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [25, 32, 35, 50, 74]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [25, 32, 39, 49, 51, 53]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2686', '1.800', '0.1405', '1.800', '0.0882', '7.000', '0.7082', 1, 1, 1, 1, 1726472943.3465407]
VI_after__Init : ['1.202', '0.2685', '1.800', '0.1405', '1.800', '0.0825', '7.000', '0.7078', 1, 1, 1, 1, 1726472951.3630054]
VI_at__the_End : ['1.202', '0.4996', '1.800', '0.1345', '1.806', '0.1111', '7.000', '0.7089', 1, 1, 1, 1, 1726473018.5709186]