TEST_NAME : Wafer
TEST_DATE : 24_09_16-09_45_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-017-021-11 | FUSED_ID : 6359364768400216411
  IC_TEMP :  -51.46 | VDDM : 1126.45 | AUX_INT :   -6.27 | CsaBias :   87.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.58643e-04 / 2
  ADC_P0  : -6.26786e-03 ± 2.09521e-02
  ADC_P1  : 7.87192e-03 ± 4.84733e-04
  ADC_P2  : -5.19522e-06 ± 2.21702e-06
  CSA_Chi2/NDF : 5.87890e-05 / 2
  CSA_P0  : 5.98594e-02 ± 5.11411e-03
  CSA_P1  : 8.94673e-03 ± 3.85311e-04
  CSA_P2  : -3.09448e-05 ± 5.86784e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [21, 106, 112, 114, 118, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [31, 46, 52, 53, 109, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2077', '1.800', '0.1298', '1.800', '0.0920', '7.000', '0.7080', 1, 1, 1, 1, 1726472749.582116]
VI_after__Init : ['1.202', '0.2077', '1.800', '0.1298', '1.800', '0.0864', '7.000', '0.7079', 1, 1, 1, 1, 1726472757.683624]
VI_at__the_End : ['1.202', '0.4980', '1.800', '0.1369', '1.800', '0.1128', '7.000', '0.7086', 1, 1, 1, 1, 1726472824.2265716]