TEST_NAME : Wafer
TEST_DATE : 24_09_16-09_44_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-017-022-11 | FUSED_ID : 6359364768400216427
  IC_TEMP :  -51.76 | VDDM : 1144.59 | AUX_INT : -199.75 | CsaBias :  -55.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01936e-03 / 2
  ADC_P0  : -1.99746e-01 ± 3.06024e-02
  ADC_P1  : 1.04962e-02 ± 6.50852e-04
  ADC_P2  : -1.37959e-05 ± 2.72751e-06
  CSA_Chi2/NDF : 7.85833e-05 / 2
  CSA_P0  : 5.72746e-02 ± 5.91272e-03
  CSA_P1  : 9.29852e-03 ± 4.45481e-04
  CSA_P2  : -3.40048e-05 ± 6.78415e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [5, 25, 65, 91]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [0, 11, 18, 49, 91, 101, 106, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0956', '1.800', '0.1646', '1.800', '0.0821', '7.000', '0.7079', 1, 1, 1, 1, 1726472651.3906643]
VI_after__Init : ['1.202', '0.0957', '1.800', '0.1645', '1.800', '0.0764', '7.000', '0.7079', 1, 1, 1, 1, 1726472659.4870398]
VI_at__the_End : ['1.202', '0.5050', '1.800', '0.1376', '1.800', '0.1107', '7.000', '0.7086', 1, 1, 1, 1, 1726472726.481832]