TEST_NAME : Wafer
TEST_DATE : 24_09_25-11_40_37
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-002-010-00 | FUSED_ID : 6359364768406446240
  IC_TEMP :  -70.05 | VDDM : 1100.93 | AUX_INT :   19.14 | CsaBias :   83.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.14157e-03 / 2
  ADC_P0  : 1.91435e-02 ± 3.13096e-02
  ADC_P1  : 8.14381e-03 ± 7.75317e-04
  ADC_P2  : -5.02975e-06 ± 3.80078e-06
  CSA_Chi2/NDF : 1.91690e-04 / 2
  CSA_P0  : 5.67100e-02 ± 9.23469e-03
  CSA_P1  : 9.74468e-03 ± 6.95767e-04
  CSA_P2  : -5.09671e-05 ± 1.05957e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [7, 66, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1597', '1.799', '0.1524', '1.800', '0.0901', '7.000', '0.7075', 1, 1, 1, 1, 1727257237.1874459]
VI_after__Init : ['1.200', '0.1597', '1.800', '0.1524', '1.803', '0.0844', '7.000', '0.7073', 1, 1, 1, 1, 1727257245.6768093]
VI_at__the_End : ['1.201', '0.4636', '1.800', '0.1338', '1.800', '0.1164', '7.000', '0.7083', 1, 1, 1, 1, 1727257301.2534878]