TEST_NAME : Wafer
TEST_DATE : 24_09_25-11_47_09
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-002-014-00 | FUSED_ID : 6359364768406446304
  IC_TEMP :  -59.12 | VDDM : 1111.39 | AUX_INT :   -8.95 | CsaBias :   68.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23285e-03 / 2
  ADC_P0  : -8.95356e-03 ± 2.37188e-02
  ADC_P1  : 8.62331e-03 ± 5.82123e-04
  ADC_P2  : -7.11795e-06 ± 2.82712e-06
  CSA_Chi2/NDF : 1.33622e-04 / 2
  CSA_P0  : 5.50806e-02 ± 7.71012e-03
  CSA_P1  : 9.45304e-03 ± 5.80902e-04
  CSA_P2  : -4.15909e-05 ± 8.84645e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3751', '1.800', '0.1508', '1.800', '0.0950', '7.000', '0.7073', 1, 1, 1, 1, 1727257629.4441557]
VI_after__Init : ['1.201', '0.3753', '1.800', '0.1505', '1.800', '0.0897', '7.000', '0.7071', 1, 1, 1, 1, 1727257637.7534685]
VI_at__the_End : ['1.201', '0.4789', '1.799', '0.1338', '1.801', '0.1120', '7.000', '0.7077', 1, 1, 1, 1, 1727257697.6670046]