TEST_NAME : Wafer
TEST_DATE : 24_09_25-11_48_47
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-002-015-00 | FUSED_ID : 6359364768406446320
  IC_TEMP :  -64.63 | VDDM : 1117.14 | AUX_INT :  -10.56 | CsaBias :   81.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72581e-03 / 2
  ADC_P0  : -1.05622e-02 ± 2.81180e-02
  ADC_P1  : 8.43121e-03 ± 6.72777e-04
  ADC_P2  : -6.65855e-06 ± 3.20071e-06
  CSA_Chi2/NDF : 1.26869e-04 / 2
  CSA_P0  : 5.62543e-02 ± 7.51277e-03
  CSA_P1  : 9.47662e-03 ± 5.66033e-04
  CSA_P2  : -4.26657e-05 ± 8.62001e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1971', '1.800', '0.1296', '1.800', '0.0817', '7.000', '0.7069', 1, 1, 1, 1, 1727257727.4718907]
VI_after__Init : ['1.201', '0.1971', '1.800', '0.1297', '1.799', '0.0761', '7.000', '0.7070', 1, 1, 1, 1, 1727257735.69415]
VI_at__the_End : ['1.201', '0.4774', '1.800', '0.1349', '1.801', '0.1140', '7.000', '0.7077', 1, 1, 1, 1, 1727257797.487579]