TEST_NAME : Wafer
TEST_DATE : 24_09_25-11_50_25
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-002-016-07 | FUSED_ID : 6359364768406446343
  IC_TEMP :  -61.88 | VDDM : 1119.95 | AUX_INT :   -8.39 | CsaBias :   75.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28354e-03 / 2
  ADC_P0  : -8.38733e-03 ± 2.42754e-02
  ADC_P1  : 8.40240e-03 ± 5.97111e-04
  ADC_P2  : -5.86791e-06 ± 2.91181e-06
  CSA_Chi2/NDF : 1.18931e-04 / 2
  CSA_P0  : 5.72886e-02 ± 7.27394e-03
  CSA_P1  : 9.67708e-03 ± 5.48039e-04
  CSA_P2  : -4.32145e-05 ± 8.34598e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [31, 56, 62, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3079', '1.800', '0.1677', '1.800', '0.0907', '7.000', '0.7072', 1, 1, 1, 1, 1727257825.922361]
VI_after__Init : ['1.201', '0.3080', '1.800', '0.1677', '1.801', '0.0852', '7.000', '0.7071', 1, 1, 1, 1, 1727257834.1468232]
VI_at__the_End : ['1.201', '0.4915', '1.802', '0.1371', '1.799', '0.1128', '7.000', '0.7077', 1, 1, 1, 1, 1727257902.390686]