TEST_NAME : Wafer
TEST_DATE : 24_09_25-11_52_04
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-002-017-07 | FUSED_ID : 6359364768406446359
  IC_TEMP :  -60.11 | VDDM : 1120.83 | AUX_INT :   -6.91 | CsaBias :   70.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.11808e-04 / 2
  ADC_P0  : -6.90597e-03 ± 2.04205e-02
  ADC_P1  : 8.61653e-03 ± 5.15591e-04
  ADC_P2  : -6.42753e-06 ± 2.56787e-06
  CSA_Chi2/NDF : 1.39962e-04 / 2
  CSA_P0  : 5.79592e-02 ± 7.89093e-03
  CSA_P1  : 9.95242e-03 ± 5.94525e-04
  CSA_P2  : -4.82498e-05 ± 9.05391e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [60, 68]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [1]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2390', '1.799', '0.1575', '1.799', '0.0912', '7.000', '0.7070', 1, 1, 1, 1, 1727257923.9040668]
VI_after__Init : ['1.201', '0.2390', '1.800', '0.1573', '1.800', '0.0856', '7.000', '0.7070', 1, 1, 1, 1, 1727257932.1804545]
VI_at__the_End : ['1.201', '0.4882', '1.804', '0.1356', '1.800', '0.1139', '7.000', '0.7079', 1, 1, 1, 1, 1727257993.4707658]