TEST_NAME : Wafer
TEST_DATE : 24_09_25-11_53_41
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-002-018-07 | FUSED_ID : 6359364768406446375
  IC_TEMP :  -61.60 | VDDM : 1127.06 | AUX_INT :  -10.55 | CsaBias :   81.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.67733e-03 / 2
  ADC_P0  : -1.05469e-02 ± 2.77289e-02
  ADC_P1  : 8.40129e-03 ± 6.65499e-04
  ADC_P2  : -6.31334e-06 ± 3.18339e-06
  CSA_Chi2/NDF : 1.11470e-04 / 2
  CSA_P0  : 5.67301e-02 ± 7.04207e-03
  CSA_P1  : 9.54721e-03 ± 5.30569e-04
  CSA_P2  : -4.15010e-05 ± 8.07995e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.0411', '1.800', '0.1452', '1.800', '0.0790', '7.000', '0.7070', 1, 1, 1, 1, 1727258020.95678]
VI_after__Init : ['1.202', '0.0411', '1.800', '0.1452', '1.800', '0.0738', '7.000', '0.7072', 1, 1, 1, 1, 1727258029.712158]
VI_at__the_End : ['1.201', '0.4904', '1.800', '0.1360', '1.799', '0.1139', '7.000', '0.7078', 1, 1, 1, 1, 1727258090.9674242]