TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_19_47
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-003-008-13 | FUSED_ID : 6359364768406450317
  IC_TEMP :  -59.79 | VDDM : 1120.31 | AUX_INT :   -7.29 | CsaBias :   76.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.97934e-04 / 2
  ADC_P0  : -7.29263e-03 ± 2.13961e-02
  ADC_P1  : 8.48387e-03 ± 5.35505e-04
  ADC_P2  : -5.84396e-06 ± 2.65266e-06
  CSA_Chi2/NDF : 2.05488e-04 / 2
  CSA_P0  : 5.68964e-02 ± 9.56128e-03
  CSA_P1  : 1.02609e-02 ± 7.20374e-04
  CSA_P2  : -5.09420e-05 ± 1.09704e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [10]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2766', '1.800', '0.1665', '1.799', '0.0933', '7.000', '0.7077', 1, 1, 1, 1, 1727259587.7014809]
VI_after__Init : ['1.202', '0.2770', '1.800', '0.1665', '1.802', '0.0877', '7.000', '0.7077', 1, 1, 1, 1, 1727259595.9110966]
VI_at__the_End : ['1.202', '0.4990', '1.800', '0.1410', '1.803', '0.1126', '7.000', '0.7087', 1, 1, 1, 1, 1727259661.3331194]