TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_14_55
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-003-011-13 | FUSED_ID : 6359364768406450365
  IC_TEMP :  -59.57 | VDDM : 1124.48 | AUX_INT :   -5.70 | CsaBias :   82.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.11030e-04 / 2
  ADC_P0  : -5.69541e-03 ± 1.92553e-02
  ADC_P1  : 8.11295e-03 ± 4.59510e-04
  ADC_P2  : -5.56567e-06 ± 2.16485e-06
  CSA_Chi2/NDF : 9.23882e-05 / 2
  CSA_P0  : 5.68578e-02 ± 6.41107e-03
  CSA_P1  : 8.99974e-03 ± 4.83028e-04
  CSA_P2  : -3.48534e-05 ± 7.35594e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [40]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3300', '1.800', '0.1405', '1.800', '0.0898', '7.000', '0.7079', 1, 1, 1, 1, 1727259295.1033416]
VI_after__Init : ['1.202', '0.3300', '1.800', '0.1405', '1.800', '0.0880', '7.000', '0.7077', 1, 1, 1, 1, 1727259303.2767062]
VI_at__the_End : ['1.202', '0.4829', '1.800', '0.1332', '1.799', '0.1117', '7.000', '0.7086', 1, 1, 1, 1, 1727259364.1189988]