TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_13_17
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-003-012-13 | FUSED_ID : 6359364768406450381
  IC_TEMP :  -55.28 | VDDM : 1120.37 | AUX_INT :   -9.76 | CsaBias :   83.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.65175e-03 / 2
  ADC_P0  : -9.76160e-03 ± 2.75432e-02
  ADC_P1  : 7.83176e-03 ± 6.19220e-04
  ADC_P2  : -5.51194e-06 ± 2.76343e-06
  CSA_Chi2/NDF : 8.92850e-05 / 2
  CSA_P0  : 5.63868e-02 ± 6.30248e-03
  CSA_P1  : 9.09755e-03 ± 4.74847e-04
  CSA_P2  : -3.64816e-05 ± 7.23135e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [93]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3317', '1.800', '0.1644', '1.800', '0.0956', '7.000', '0.7075', 1, 1, 1, 1, 1727259197.7357638]
VI_after__Init : ['1.202', '0.3319', '1.800', '0.1644', '1.800', '0.0899', '7.000', '0.7079', 1, 1, 1, 1, 1727259205.7371838]
VI_at__the_End : ['1.202', '0.4826', '1.800', '0.1338', '1.800', '0.1117', '7.000', '0.7082', 1, 1, 1, 1, 1727259272.1601186]