TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_10_00
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-003-014-13 | FUSED_ID : 6359364768406450413
  IC_TEMP :  -61.36 | VDDM : 1129.29 | AUX_INT : -146.57 | CsaBias :  -28.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07197e-03 / 2
  ADC_P0  : -1.46570e-01 ± 2.86433e-02
  ADC_P1  : 1.08493e-02 ± 6.89666e-04
  ADC_P2  : -1.41400e-05 ± 3.26663e-06
  CSA_Chi2/NDF : 1.48221e-04 / 2
  CSA_P0  : 5.81528e-02 ± 8.12041e-03
  CSA_P1  : 9.90440e-03 ± 6.11814e-04
  CSA_P2  : -4.71288e-05 ± 9.31720e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [9, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3337', '1.800', '0.1714', '1.799', '0.0869', '7.000', '0.7078', 1, 1, 1, 1, 1727259000.3259568]
VI_after__Init : ['1.201', '0.3340', '1.799', '0.1714', '1.800', '0.0812', '7.000', '0.7079', 1, 1, 1, 1, 1727259009.1033244]
VI_at__the_End : ['1.201', '0.4908', '1.800', '0.1380', '1.800', '0.1128', '7.000', '0.7082', 1, 1, 1, 1, 1727259076.7980082]