TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_08_22
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-003-015-13 | FUSED_ID : 6359364768406450429
  IC_TEMP :  -62.26 | VDDM : 1121.80 | AUX_INT :   -7.97 | CsaBias :   66.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11685e-03 / 2
  ADC_P0  : -7.97051e-03 ± 2.26030e-02
  ADC_P1  : 8.38363e-03 ± 5.49350e-04
  ADC_P2  : -6.25623e-06 ± 2.63955e-06
  CSA_Chi2/NDF : 1.43122e-04 / 2
  CSA_P0  : 5.69557e-02 ± 7.97950e-03
  CSA_P1  : 1.00803e-02 ± 6.01198e-04
  CSA_P2  : -5.04233e-05 ± 9.15553e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [26]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3306', '1.799', '0.1848', '1.800', '0.0940', '7.000', '0.7076', 1, 1, 1, 1, 1727258902.3174946]
VI_after__Init : ['1.201', '0.3310', '1.800', '0.1849', '1.799', '0.0884', '7.000', '0.7076', 1, 1, 1, 1, 1727258910.991775]
VI_at__the_End : ['1.201', '0.4900', '1.803', '0.1376', '1.803', '0.1126', '7.000', '0.7082', 1, 1, 1, 1, 1727258971.8301702]