TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_06_45
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-003-016-10 | FUSED_ID : 6359364768406450442
  IC_TEMP :  -62.51 | VDDM : 1121.25 | AUX_INT :   -7.83 | CsaBias :   76.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12917e-03 / 2
  ADC_P0  : -7.83415e-03 ± 2.27348e-02
  ADC_P1  : 8.53537e-03 ± 5.64063e-04
  ADC_P2  : -6.42689e-06 ± 2.76532e-06
  CSA_Chi2/NDF : 1.33380e-04 / 2
  CSA_P0  : 5.89674e-02 ± 7.70313e-03
  CSA_P1  : 9.97230e-03 ± 5.80375e-04
  CSA_P2  : -4.85149e-05 ± 8.83843e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [78, 93]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [36, 77, 97, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2682', '1.800', '0.1822', '1.800', '0.0927', '7.000', '0.7077', 1, 1, 1, 1, 1727258804.99998]
VI_after__Init : ['1.201', '0.2683', '1.800', '0.1823', '1.800', '0.0871', '7.000', '0.7076', 1, 1, 1, 1, 1727258813.0593526]
VI_at__the_End : ['1.201', '0.4906', '1.800', '0.1360', '1.804', '0.1135', '7.000', '0.7083', 1, 1, 1, 1, 1727258877.2523172]