TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_05_07
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-003-017-10 | FUSED_ID : 6359364768406450458
  IC_TEMP :  -58.77 | VDDM : 1115.80 | AUX_INT :   -7.36 | CsaBias :   76.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09237e-03 / 2
  ADC_P0  : -7.35851e-03 ± 2.23785e-02
  ADC_P1  : 8.49572e-03 ± 5.58249e-04
  ADC_P2  : -6.12719e-06 ± 2.74967e-06
  CSA_Chi2/NDF : 1.13761e-04 / 2
  CSA_P0  : 5.79817e-02 ± 7.11408e-03
  CSA_P1  : 9.67129e-03 ± 5.35995e-04
  CSA_P2  : -4.36440e-05 ± 8.16257e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4831', '1.800', '0.1685', '1.800', '0.0957', '7.000', '0.7076', 1, 1, 1, 1, 1727258706.8955245]
VI_after__Init : ['1.201', '0.4841', '1.800', '0.1683', '1.800', '0.0904', '7.000', '0.7077', 1, 1, 1, 1, 1727258714.993846]
VI_at__the_End : ['1.201', '0.4902', '1.801', '0.1371', '1.804', '0.1111', '7.000', '0.7082', 1, 1, 1, 1, 1727258779.318913]