TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_01_50
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-003-019-10 | FUSED_ID : 6359364768406450490
  IC_TEMP :  -59.77 | VDDM : 1106.21 | AUX_INT :   -7.92 | CsaBias :   78.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33410e-03 / 2
  ADC_P0  : -7.92089e-03 ± 2.47951e-02
  ADC_P1  : 7.91877e-03 ± 5.85123e-04
  ADC_P2  : -4.71494e-06 ± 2.73830e-06
  CSA_Chi2/NDF : 1.40765e-04 / 2
  CSA_P0  : 5.63803e-02 ± 7.91352e-03
  CSA_P1  : 9.76106e-03 ± 5.96227e-04
  CSA_P2  : -4.55726e-05 ± 9.07982e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2580', '1.800', '0.1279', '1.799', '0.0852', '7.000', '0.7076', 1, 1, 1, 1, 1727258509.7676296]
VI_after__Init : ['1.201', '0.2579', '1.800', '0.1279', '1.799', '0.0797', '7.000', '0.7076', 1, 1, 1, 1, 1727258517.8059254]
VI_at__the_End : ['1.201', '0.4868', '1.800', '0.1338', '1.800', '0.1118', '7.000', '0.7083', 1, 1, 1, 1, 1727258581.496084]