TEST_NAME : Wafer
TEST_DATE : 24_09_25-11_58_34
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-003-021-10 | FUSED_ID : 6359364768406450522
  IC_TEMP :  -58.20 | VDDM : 1119.10 | AUX_INT :   -9.97 | CsaBias :   72.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69824e-03 / 2
  ADC_P0  : -9.97420e-03 ± 2.80007e-02
  ADC_P1  : 8.31739e-03 ± 6.89738e-04
  ADC_P2  : -4.96458e-06 ± 3.39960e-06
  CSA_Chi2/NDF : 1.98286e-04 / 2
  CSA_P0  : 5.60464e-02 ± 9.39222e-03
  CSA_P1  : 1.04234e-02 ± 7.07636e-04
  CSA_P2  : -5.37342e-05 ± 1.07765e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [30, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3556', '1.800', '0.1683', '1.800', '0.0947', '7.000', '0.7076', 1, 1, 1, 1, 1727258314.2664888]
VI_after__Init : ['1.201', '0.3557', '1.800', '0.1683', '1.800', '0.0890', '7.000', '0.7076', 1, 1, 1, 1, 1727258322.3518217]
VI_at__the_End : ['1.201', '0.4953', '1.800', '0.1379', '1.800', '0.1132', '7.000', '0.7082', 1, 1, 1, 1, 1727258388.8207397]