TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_24_41
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-004-007-05 | FUSED_ID : 6359364768406454389
  IC_TEMP :  -56.57 | VDDM : 1120.26 | AUX_INT :  -26.91 | CsaBias :   56.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.79042e-03 / 2
  ADC_P0  : -2.69106e-02 ± 2.97466e-02
  ADC_P1  : 8.44509e-03 ± 7.09443e-04
  ADC_P2  : -6.19134e-06 ± 3.35975e-06
  CSA_Chi2/NDF : 1.38615e-04 / 2
  CSA_P0  : 5.82274e-02 ± 7.85284e-03
  CSA_P1  : 9.75511e-03 ± 5.91655e-04
  CSA_P2  : -4.35059e-05 ± 9.01021e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [62]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [46, 54, 74]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2300', '1.800', '0.1418', '1.799', '0.0869', '7.000', '0.7079', 1, 1, 1, 1, 1727259881.2158267]
VI_after__Init : ['1.202', '0.2303', '1.800', '0.1418', '1.801', '0.0817', '7.000', '0.7077', 1, 1, 1, 1, 1727259889.420169]
VI_at__the_End : ['1.202', '0.4939', '1.800', '0.1373', '1.799', '0.1116', '7.000', '0.7088', 1, 1, 1, 1, 1727259948.770654]