TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_26_19
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-004-008-05 | FUSED_ID : 6359364768406454405
  IC_TEMP :  -56.22 | VDDM : 1121.57 | AUX_INT :   -6.56 | CsaBias :   81.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.47898e-04 / 2
  ADC_P0  : -6.56128e-03 ± 1.97441e-02
  ADC_P1  : 8.08231e-03 ± 4.80883e-04
  ADC_P2  : -4.63322e-06 ± 2.32194e-06
  CSA_Chi2/NDF : 1.39994e-04 / 2
  CSA_P0  : 5.88295e-02 ± 7.89183e-03
  CSA_P1  : 9.87691e-03 ± 5.94592e-04
  CSA_P2  : -4.53828e-05 ± 9.05494e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [86, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2918', '1.800', '0.1729', '1.800', '0.0865', '7.000', '0.7080', 1, 1, 1, 1, 1727259979.38844]
VI_after__Init : ['1.202', '0.2919', '1.800', '0.1729', '1.800', '0.0814', '7.000', '0.7079', 1, 1, 1, 1, 1727259987.3877828]
VI_at__the_End : ['1.202', '0.4947', '1.799', '0.1388', '1.799', '0.1105', '7.000', '0.7083', 1, 1, 1, 1, 1727260054.232862]