TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_27_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-004-009-05 | FUSED_ID : 6359364768406454421
  IC_TEMP :  -66.64 | VDDM : 1115.35 | AUX_INT :   -5.58 | CsaBias :   73.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.03847e-04 / 2
  ADC_P0  : -5.57949e-03 ± 1.50923e-02
  ADC_P1  : 8.90249e-03 ± 3.82246e-04
  ADC_P2  : -8.08230e-06 ± 1.89743e-06
  CSA_Chi2/NDF : 2.33617e-04 / 2
  CSA_P0  : 5.86558e-02 ± 1.01947e-02
  CSA_P1  : 1.03059e-02 ± 7.68098e-04
  CSA_P2  : -5.38349e-05 ± 1.16972e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [15, 102, 103, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [69, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0782', '1.800', '0.1838', '1.800', '0.0812', '7.000', '0.7079', 1, 1, 1, 1, 1727260077.1492136]
VI_after__Init : ['1.202', '0.0782', '1.800', '0.1840', '1.800', '0.0761', '7.000', '0.7079', 1, 1, 1, 1, 1727260085.2754302]
VI_at__the_End : ['1.202', '0.4901', '1.799', '0.1585', '1.808', '0.1143', '7.000', '0.7083', 1, 1, 1, 1, 1727260151.930548]