TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_29_35
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-004-010-05 | FUSED_ID : 6359364768406454437
  IC_TEMP :  -54.01 | VDDM : 1114.13 | AUX_INT :   -9.24 | CsaBias :   73.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49164e-03 / 2
  ADC_P0  : -9.23636e-03 ± 2.61798e-02
  ADC_P1  : 8.34311e-03 ± 6.33073e-04
  ADC_P2  : -5.98387e-06 ± 3.03985e-06
  CSA_Chi2/NDF : 9.72587e-05 / 2
  CSA_P0  : 5.82277e-02 ± 6.57789e-03
  CSA_P1  : 9.08130e-03 ± 4.95597e-04
  CSA_P2  : -3.49218e-05 ± 7.54735e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [39, 82, 83, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3582', '1.800', '0.1634', '1.799', '0.0907', '7.000', '0.7079', 1, 1, 1, 1, 1727260175.6995687]
VI_after__Init : ['1.201', '0.3585', '1.800', '0.1634', '1.800', '0.0852', '7.000', '0.7079', 1, 1, 1, 1, 1727260183.7830272]
VI_at__the_End : ['1.202', '0.4896', '1.800', '0.1373', '1.804', '0.1111', '7.000', '0.7086', 1, 1, 1, 1, 1727260243.2395961]